Test Problem Generator by Neural Network for Algorithms that Try Solving Nonlinear Programming Problems Globally

  • Authors:
  • Degang Liu;Xiang-Sun Zhang

  • Affiliations:
  • Academy of Mathematics and System sciences , Institute of Applied Mathematics , Chinese Academy of Sciences , Beijing 100080, China (e-mail: dliu@math2.amt.ac.cn);Academy of Mathematics and System sciences , Institute of Applied Mathematics , Chinese Academy of Sciences , Beijing 100080, China (e-mail: xszhang@amath2.amt.ac.cn)

  • Venue:
  • Journal of Global Optimization
  • Year:
  • 2000

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Abstract

A test problem generator, by means of neural networks nonlinear function approximation capability, is given in this paper which provides test problems, with many predetermined local minima and a global minimum, to evaluate nonlinear programming algorithms that are designed to solve the problem globally.