Embedding built-in tests in hot spots of an object-oriented framework

  • Authors:

  • Taewoong Jeon;Hyon Woo Seung;Sungyoung Lee

  • Affiliations:

  • Korea University, Chochiwon, Choongnam, Korea;Seoul Women's University;Kyunghee University

  • Venue:
  • ACM SIGPLAN Notices
  • Year:
  • 2002

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Abstract

This paper describes a scheme of encapsulating test support code as built-in test (BIT) components and embedding them into the hot spots of an object-oriented framework so that defects caused by the modification and extension of the framework can be detected effectively and efficiently through testing. The test components embedded into a framework in this way increase the testability of the framework by making it easy to control and observe the process of framework testing. The proposed technique is illustrated using the facilities of C++. Our testing scheme, however, is equally applicable to other object-oriented languages. Using our scheme, test components can be designed and embedded into the hot spots of a framework without incurring changes or intervention to the framework code, and also can be attached and detached dynamically to/from the framework as needed at run-time.