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IEEE Transactions on Pattern Analysis and Machine Intelligence
One-Pass Parallel Thinning: Analysis, Properties, and Quantitative Evaluation
IEEE Transactions on Pattern Analysis and Machine Intelligence
Feature Analysis Using Line Sweep Thinning Algorithm
IEEE Transactions on Pattern Analysis and Machine Intelligence
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IEEE Transactions on Pattern Analysis and Machine Intelligence
A Shape Analysis Model with Applications to a Character Recognition System
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PCM'04 Proceedings of the 5th Pacific Rim conference on Advances in Multimedia Information Processing - Volume Part I
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