A fault tolerant multistage interconnection network with partly duplicated switches

  • Authors:

  • Naotake Kamiura;Takashi Kodera;Nobuyuki Matsui

  • Affiliations:

  • Department of Computer Engineering, Himeji Institute of Technology, 2167, Shosha, 671-2201 Himeji, Hyogo, Japan;Department of Computer Engineering, Himeji Institute of Technology, 2167, Shosha, 671-2201 Himeji, Hyogo, Japan;Department of Computer Engineering, Himeji Institute of Technology, 2167, Shosha, 671-2201 Himeji, Hyogo, Japan

  • Venue:
  • Journal of Systems Architecture: the EUROMICRO Journal - Defect and fault tolerance in VLSI Systems
  • Year:
  • 2002

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Abstract

A multistage interconnection network (MIN) with partly duplicated stages is proposed in this paper, and network performance and fault tolerance are analyzed. The MIN is a hybrid of a non-redundant baseline network and a conventional fault-tolerant MIN called an ELMIN. In the case of a MIN with N input terminals and N output terminals, switching elements (SEs) in the first and nth stages are duplicated where n = log2N, and four-input two-output SEs and two-input four-output SEs are employed in the second and (n - 1)th stages respectively. These extra SEs and links are useful in improving the fault tolerance and performance of the MIN and do not complicate the routing algorithm. A comparison of an ELMIN with the proposed MIN shows that this new approach is superior both in theoretical throughput and performance in faulty cases, even though it requires at most 1.33 times as many links and cross points in the SEs.