Using Inspection Data for Defect Estimation

  • Authors:
  • Stefan Biffl

  • Affiliations:
  • -

  • Venue:
  • IEEE Software
  • Year:
  • 2000

Quantified Score

Hi-index 0.01

Visualization

Abstract

This article pro-poses subjective team estimation models calculated from individual estimates and investigates the accuracy of defect estimation models based on inspection data.