A Transition Sequence Generator for RAM Fault Detection

  • Authors:
  • E. Regener

  • Affiliations:
  • -

  • Venue:
  • IEEE Transactions on Computers
  • Year:
  • 1988

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Abstract

In verification of n-bit CMOS memories it is usual to supply a test address sequence having n2/sup /n transitions, one for each ordered pair of n-bit words which differ in a single bit. From an inductive definition of a sequence with these properties, a succession of algorithms yielding the logic circuit of a next-state generator for the sequence is developed. Proving these algorithms equivalent demonstrates the correctness of the circuit rigorously.