Model-Based, Multiple-Fault Diagnosis of Dynamic, Continuous Physical Devices

  • Authors:
  • Hwee Tou Ng

  • Affiliations:
  • -

  • Venue:
  • IEEE Expert: Intelligent Systems and Their Applications
  • Year:
  • 1991

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Abstract

A diagnosis algorithm called Inc-Diagnose that can generate diagnosis candidates incrementally and detect multiple faults is presented. It models continuously changing device states using a discrete set of Qsim qualitative states over time. Inc-Diagnose is a modification of R. Reiter's algorithm (Artif. Intell., vol.32., no.1, p.57-95, 1987), the theory of which is reviewed. An example diagnosis is given.