Exact corner location using attentional generalized symmetry transform

  • Authors:
  • Hyun-Hwa Oh;Sung-Il Chien

  • Affiliations:
  • School of Electronic and Electrical Engineering, Kyungpook National University, Sangyuk-dong 1370, Puk-gu, Daegu 702-701, South Korea;School of Electronic and Electrical Engineering, Kyungpook National University, Sangyuk-dong 1370, Puk-gu, Daegu 702-701, South Korea

  • Venue:
  • Pattern Recognition Letters
  • Year:
  • 2002

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Abstract

Local symmetry is often visible at the corner points. In this paper, generalized symmetry transform (GST) [Reisfeld et al., Internat. J. Comput. Vision 14 (1995) 119] is combined with the proposed parametric corner equation in order to detect corners and improve their localization. Experimental results show that the proposed corner detection algorithm is efficient and robust to noise when tested on the real and artificial images and compared to the other detectors.