Similarity-based reasoning about diagnosis of analog circuits

Authors:
Juan E. Vargas;J. R. Bourne;A. J, Brodersen;Martin Hofmann;G. C. Collins
Affiliations:
Vanderbilt Univ., Nashville, TN;Vanderbilt Univ., Nashville, TN;Vanderbilt Univ., Nashville, TN;Vanderbilt Univ., Nashville, TN;Vanderbilt Univ., Nashville, TN
Venue:
IEA/AIE '88 Proceedings of the 1st international conference on Industrial and engineering applications of artificial intelligence and expert systems - Volume 1
Year:
1988

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Abstract

This paper advocates the use of similarity-based reasoning to improve the efficacy of AI applications dealing with diagnosis of electronic circuits. A paradigm for similarity-based matching is presented, application of this paradigm to diagnosis of electronic circuits is discussed, and a system architecture that supports this concept is described.