Binary Decision Tree Test Functions

Authors:
S. Aborhey
Affiliations:
Univ. of Jos, Makurdi, Benue State, Nigeria
Venue:
IEEE Transactions on Computers
Year:
1988

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Abstract

A class of multivariable logic functions which are suitable for use as binary decision tree node test functions is considered. These functions can be regarded as a natural extension of the polarity test normally used. The properties of these functions are discussed. A method for obtaining a reduced but not necessarily optimal tree is presented.