The first return time test of pseudorandom numbers

  • Authors:
  • Geon Ho Choe;Dong Han Kim

  • Affiliations:
  • Department of Mathematics, Korea Advanced Institute of Science and Technology, 373-1 Kusong-dong, Yusong-gu, Taejon 305-701, South Korea;Department of Mathematics, Korea Advanced Institute of Science and Technology, 373-1 Kusong-dong, Yusong-gu, Taejon 305-701, South Korea

  • Venue:
  • Journal of Computational and Applied Mathematics
  • Year:
  • 2002

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Abstract

An algorithm for obtaining the probability distribution of the first return time Rn with an overlapping for the initial n-block is presented and used to test pseudorandom number generators. First, the averages and the standard deviations of Rn, √Rn and log Rn are computed theoretically and next their sample values are obtained and finally, the usual Z-test is applied.