Characterization of digitizer timebase jitter by means of the Allan variance

  • Authors:

  • Pasquale Arpaia;Pasquale Daponte;Sergio Rapuano

  • Affiliations:

  • Dipartimento di Ingegneria, Università del Sannio, Corso Garibaldi 107, Benevento 82100, Italy;Dipartimento di Ingegneria, Università del Sannio, Corso Garibaldi 107, Benevento 82100, Italy;Dipartimento di Ingegneria, Università del Sannio, Corso Garibaldi 107, Benevento 82100, Italy

  • Venue:
  • Computer Standards & Interfaces - Special issue on Analog-to-digital converters (ADCs) testing
  • Year:
  • 2003

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Abstract

A comprehensive framework for the metrological characterization of timebase jitter in waveform digitizers is proposed. With this aim, the Allan variance is shown to be a sound basis for defining a suitable figure of merit, setting up an experimental test procedure, diagnosing the jitter noise type, and modeling the jitter error. Experimental results highlighting the effectiveness of the Allan variance in the metrological characterization of digitizer jitter are discussed.