New methods to improve convergence of sine fitting algorithms

Authors:
M. Fonseca da Silva;A. Cruz Serra
Affiliations:
Instituto de Telecomunicações/DEEC, IST, Lisbon Technical University, Av Rovisco Pais, 1049-001 Lisbon, Portugal;Instituto de Telecomunicações/DEEC, IST, Lisbon Technical University, Av Rovisco Pais, 1049-001 Lisbon, Portugal
Venue:
Computer Standards & Interfaces - Special issue on Analog-to-digital converters (ADCs) testing
Year:
2003

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Abstract

One of the recommended test methods in Analog to Digital testing standards is based on least square sine fitting algorithms. The parameter estimation provided by these algorithms is exposed to errors due to different causes. In particular convergence to local minimums of the error function is an open problem. In this paper we present new methods that improve results in sine wave parameter estimation when the frequency is unknown, assuring convergence even in the presence of saturation, noise or distortion. These new methods are also usable in other signal processing applications since they work without loss of quality when only one period of the input signal is acquired.