M. Kamada;K. Toraichi;R. Mori;K. Yamamoto;H. Yamada
Univ. of Tsukuba, Tsukuba, Japan;Univ. of Tsukuba, Tsukuba, Japan;Univ. of Tskuba, Tsukuba, Japan;MITI, Sakura, Niihari, Ibaraki, Japan;MITI, Sakura, Niihari, Ibaraki, Japan
Learning Compatibility Coefficients for Relaxation Labeling Processes
IEEE Transactions on Pattern Analysis and Machine Intelligence