W. Siedlecki;K. Siedlecka;J. Sklansky
Univ. of California, Irvine;Univ. of California, Irvine;Univ. of California, Irvine
Mapping high-dimensional data onto a relative distance plane: an exact method for visualizing and characterizing high-dimensional patterns
Journal of Biomedical Informatics
Tool wear monitoring using artificial neural network based on extended Kalman filter weight updation with transformed input patterns
Journal of Intelligent Manufacturing