Beyond MTTDL: A Closed-Form RAID 6 Reliability Equation
ACM Transactions on Storage (TOS)
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From the Publisher:AudienceThis book is a needed addition to the literature, since suitable nonparametric models and data analyses for recurrent events appear in few books and much of the literature is too abstract for most practitioners who need such methodology. The intended audience for this book includes engineers, medical researchers, social scientists, statisticians, and other practitioners who encounter repeated events data. The only background needed is a basic statistics course. Previous knowledge of stochastic processes is not needed, as the simple presentation is self-contained.About the AuthorWayne B. Nelson is a leading expert on reliability data analysis and statistical methods for accelerated testing. He privately consults throughout industry on diverse engineering and scientific applications of statistics. He develops and presents statistical courses for companies, universities, and professional societies. Dr. Nelson also works as an expert witness. He is the author of two other books and more than 120 publications on statistical methods and is a Fellow of the American Statistical Association, the American Society for Quality, and the Institute of Electrical and Electronics Engineers.