Efficient analog test methodology based on adaptive algorithms
DAC '98 Proceedings of the 35th annual Design Automation Conference
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In this paper, a complete functional testing of embedded ADC is presented. The integral non-linearity error, INLE, differential non-linearity error, DNLE, offset error, OSE, gain error and the signal-to-noise ratio, SNR are rested. The problem related to the propagation of the analog signal to the input of the ADC and the observation of the digital output of the converter at the output of the digital circuit are discussed. The two means for functional testing are discussed: the histogram and the FFT. To observe the outputs of the ADC at the digital circuit, the inverse function of the digital circuit is computed. This can be done by inverting the transfer function of the digital circuit whenever it is available. In the other case, when the digital circuit structure is available, the inverse of the digital circuit is found by boolean function manipulation.