Domain Based Testing: Increasing Test Case Reuse

  • Authors:
  • Anneliese von Mayrhauser;Richard T. Mraz;Jeff Walls;Pete Ocken

  • Affiliations:
  • -;-;-;-

  • Venue:
  • ICCS '94 Proceedings of the1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors
  • Year:
  • 1994

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Abstract