A Parallel Genetic Algorithm for Automatic Generation of Test Sequences for Digital Circuits

Authors:
Fulvio Corno;Paolo Prinetto;Maurizio Rebaudengo;Matteo Sonza Reorda
Affiliations:
-;-;-;-
Venue:
HPCN Europe 1996 Proceedings of the International Conference and Exhibition on High-Performance Computing and Networking
Year:
1996

Citing 0
Cited 1

Hidden Markov Models with Patterns to Learn Boolean Vector Sequences and Application to the Built-In Self-Test for Integrated Circuits

IEEE Transactions on Pattern Analysis and Machine Intelligence

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Abstract