Model-Based Fatique Fractographs Texture Analysis

  • Authors:
  • Michal Haindl;Hynek Lauschmann

  • Affiliations:
  • -;-

  • Venue:
  • Proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition
  • Year:
  • 2002

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Abstract

A novel model-based approach for estimation of the velocity of crack growth from microfractographical images is proposed. These images are represented by a Gaussian Markov random field model and the crack growth rate is modelled by a linear regression model in the Gaussian-Markov parameter space. The method is numerically very efficient because both crack growth rate model parameters as well as the underlying random field model parameters are estimated using fast analytical estimators.