Pattern Recognition by Invariant Reference Points

Authors:
Krystian Ignasiak;Wladyslaw Skarbek
Affiliations:
-;-
Venue:
RSCTC '98 Proceedings of the First International Conference on Rough Sets and Current Trends in Computing
Year:
1998

Citing 6
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Abstract

New methodology for pattern recognition is presented which is based on design of invariant reference points. It is shown that the k-NN distance classifier is a special case of this methodology. New classifiers within this framework are also described.