Automated Test Case Generation for Programs Specified by Relational Algebra Queries
IEEE Transactions on Software Engineering
Automated Software Test Data Generation
IEEE Transactions on Software Engineering
Constraint-Based Automatic Test Data Generation
IEEE Transactions on Software Engineering
Requirements Specification for Process-Control Systems
IEEE Transactions on Software Engineering
Theory of Fault-Based Predicate Testing for Computer Programs
IEEE Transactions on Software Engineering
Effect of test set minimization on fault detection effectiveness
Software—Practice & Experience
Test set size minimization and fault detection effectiveness: a case study in a space application
Journal of Systems and Software
Automatically Generating Test Data from a Boolean Specification
IEEE Transactions on Software Engineering
MUMCUT: A Fault-Based Strategy for Testing Boolean Specifications
APSEC '99 Proceedings of the Sixth Asia Pacific Software Engineering Conference
Sensitive test data for logic expressions
ACM SIGSOFT Software Engineering Notes
On the Automated Generation of Program Test Data
IEEE Transactions on Software Engineering
Error Sensitive Test Cases Analysis (ESTCA)
IEEE Transactions on Software Engineering
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Test suite reduction is aimed at finding representative sets that can satisfy the same testing objective as their original test suite. As a subset of the original test suite, the representative set may have less fault detection capability. However, researches show that a representative set and its original test suite have similar fault detection capabilities for the case of coverage based criteria. This paper investigates the relationship between the fault detection capabilities of a representative set and its original test suite when the generation of the test suite is based on some fault-based test case selection criteria.