Structural Sensivity for Large-Scale Line-Pattern Recognition

  • Authors:
  • Benoit Huet;Edwin R. Hancock

  • Affiliations:
  • -;-

  • Venue:
  • VISUAL '99 Proceedings of the Third International Conference on Visual Information and Information Systems
  • Year:
  • 1999

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Abstract

This paper provides a detailed sensitivity analysis for the problem of recognising line patterns from large structural libraries. The analysis focuses on the characterization of two different recognition strategies. The first is histogram-based while the second uses feature-sets. In the former case comparison is based on the Bhattacharyya distance between histograms, while in the latter case the feature-sets are compared using a probabilistic variant of the Hausdorff distance. We study the two algorithms under line-dropout, line fragmentation, line addition and line end-point position errors. The analysis reveals that while the histogram-based method is most sensitive to the addition of line segments and end-point position errors, the set-based method is most sensitive to line dropout.