Complete Tests in Algorithm-Based Fault-Tolerant Matrix Operations on Processor Arrays

• Authors:

• Dah-Yea D. Wei;Jung H. Kim;T. R. N. Rao

• Affiliations:

• -;-;-

• Venue:
• Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
• Year:
• 1993