Low-level error recovery mechanism for self-checking sequential circuits

  • Authors:
  • Michele Favalli;Cecilia Metra

  • Affiliations:
  • -;-

  • Venue:
  • DFT '97 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems
  • Year:
  • 1997

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Abstract

To match the reliability requirements of small embedded systems, a design methodology is proposed that provides some fault tolerant capabilities to self-checking sequential circuits. By means of simple modifications, such circuits are made fault tolerant with respect to transient, crosstalk and delay faults, while they maintain their self-checking capabilities with respect to permanent faults. The method requires a small area overhead and may also provide some benefit from the yield point of view.