The Impact of Commercial Off-The-Shelf (COTS) Equipment on System Test and Diagnosis
Authors:
William R. Simpson;John W. Sheppard
Affiliations:
-;-
Venue:
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Year:
1993
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The Future: Plug and Pray?
IEEE Design & Test
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Abstract