System-Level Testability of Hardware/Software Systems

• Authors:

• H. P. E. Vranken;M. P. J. Stevens;M. T. M. Segers;J. H. M. M. van Rhee

• Affiliations:

• -;-;-;-

• Venue:
• Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
• Year:
• 1994