Factorized Test Generation for Multi-Input/Output Transition Systems

  • Authors:
  • Ed Brinksma;Lex Heerink;Jan Tretmans

  • Affiliations:
  • -;-;-

  • Venue:
  • IWTCS Proceedings of the IFIP TC6 11th International Workshop on Testing Communicating Systems
  • Year:
  • 1998

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Abstract