Piecewise and Local Threshold Testability of DFA

Authors:
A. N. Trahtman
Affiliations:
-
Venue:
FCT '01 Proceedings of the 13th International Symposium on Fundamentals of Computation Theory
Year:
2001

Citing 11
Cited 3

Languages and scanners

Theoretical Computer Science
A Polynomial time Algorithm for the Local Testability Problem of Deterministic Finite Automata

IEEE Transactions on Computers
On the bound of the synchronization delay of a local automaton

Theoretical Computer Science
Families of locally testable languages

Theoretical Computer Science
Locally Threshold Testable Languages in Strict Sense: Application to the Inference Problem

ICGI '98 Proceedings of the 4th International Colloquium on Grammatical Inference
Factors of Words

ICALP '89 Proceedings of the 16th International Colloquium on Automata, Languages and Programming
Classes of Picture Languages that Cannot be Distinguished in the Chain Code Concept and Deletion of Redundant Retreats

STACS '89 Proceedings of the 6th Annual Symposium on Theoretical Aspects of Computer Science
Piecewise testable events

Proceedings of the 2nd GI Conference on Automata Theory and Formal Languages
A Precise Estimation of the Order of Local Testability of a Deterministic Finite Automaton

WIA '97 Revised Papers from the Second International Workshop on Implementing Automata
LANGAGE: A Maple Package for Automaton Characterization of Regular Languages

WIA '97 Revised Papers from the Second International Workshop on Implementing Automata
Counter-Free Automata (M.I.T. research monograph no. 65)

Counter-Free Automata (M.I.T. research monograph no. 65)

On languages piecewise testable in the strict sense

MOL'07/09 Proceedings of the 10th and 11th Biennial conference on The mathematics of language
On the state and computational complexity of the reverse of acyclic minimal DFAs

CIAA'12 Proceedings of the 17th international conference on Implementation and Application of Automata
Efficient separability of regular languages by subsequences and suffixes

ICALP'13 Proceedings of the 40th international conference on Automata, Languages, and Programming - Volume Part II

Quantified Score

Hi-index	0.00

Visualization

Abstract

The necessary and sufficient conditions for an automaton to be locally threshold testable are found. We introduce the polynomial time algorithm to verify local threshold testability of the automaton of time complexity O(n5) and an algorithm of order O(n3) for the local threshold testability problem for syntactic semigroup of the automaton. We modify necessary and sufficient conditions for piecewise testability problem for deterministic finite automaton and improve the Stern algorithm to verify piecewise testability for the automaton. The time complexity of the algorithm is reduced from O(n5) to O(n2). An algorithm to verify piecewise testability for syntactic semigroup of the automaton of order O(n2) is presented as well.