Greedy loop transversal codes for correcting error bursts

Authors:
Dug-Hwan Choi;Jonathan D. H. Smith
Affiliations:
Authentication Technology Research Center, Sungkyunkwan University, Suwon, Kyunggi-do 440-746, South Korea;Department of Mathematics, Iowa State University, Ames, IA
Venue:
Discrete Mathematics - The 2000 Com2MaC conference on association schemes, codes and designs
Year:
2003

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Abstract

The greedy loop transversal algorithm is used to construct linear codes in a binary channel for the correction of error bursts. The dimensions of the codes constructed are compared with the dimensions of the corresponding white noise greedy loop transversal codes, and with the dimensions of the few previously best-known codes for the burst-error patterns. The dimensions of the greedy loop transversal codes for burst-error correction match or exceed the dimensions of these previously known codes.