How to find biconnected components in distributed networks
Journal of Parallel and Distributed Computing
Efficient Distributed Algorithms for Self Testing of Multiple Processor Systems
IEEE Transactions on Computers
The consensus problem in fault-tolerant computing
ACM Computing Surveys (CSUR)
A Distributed System-Level Diagnosis Algorithm for Arbitrary Network Topologies
IEEE Transactions on Computers - Special issue on fault-tolerant computing
Adaptive System-Level Diagnosis for Hypercube Multiprocessors
IEEE Transactions on Computers
A Hierarchical Adaptive Distributed System-Level Diagnosis Algorithm
IEEE Transactions on Computers
Better Adaptive Diagnosis of Hypercubes
IEEE Transactions on Computers
Fundamentals of Data Structures in C
Fundamentals of Data Structures in C
An Incremental Distributed Algorithm for Computing Biconnected Components (Extended Abstract)
WDAG '94 Proceedings of the 8th International Workshop on Distributed Algorithms
An Algorithm for Distributed Hierarchical Diagnosis of Dynamic Fault and Repair Events
ICPADS '00 Proceedings of the Seventh International Conference on Parallel and Distributed Systems
International Journal of Parallel, Emergent and Distributed Systems
One-step t-fault diagnosis for hypermesh optical interconnection multiprocessor systems
Journal of Systems and Software
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We propose a partitioning method for an adaptive distributed system-level diagnosis in arbitrary network topologies. It utilizes a biconnected component as a partitioning unit. In an adaptive distributed system-level diagnosis, testing assignment algorithm is performed before each node performs actual diagnosis to reduce the number of tests in the system. Existing testing assignment algorithms adopt non-partitioning approach covering the whole system, so they incur unnecessary extra message traffic and time. In our method, the whole system is partitioned into small groups (biconnected components), and testing assignment is performed within each group. By exploiting the property of an articulation point of a biconnected component, initial testing assignment of our method performs better than non-partitioning approach by reducing the number of nodes involved in testing assignment. It also localizes the testing reassignment caused by system reconfiguration within the related biconnected components only. It is shown that our system-level diagnosis method is correct, and the number of messages required for testing assignment of our method is smaller than that of the previous non-partitioning methods. Comparisons with other partitioning approach are also presented.