A technology-independent CAD tool for ESD protection device extraction: ESDExtractor

Authors:
R. Y. Zhan;H. G. Feng;Q. Wu;G. Chen;X. K. Guan;Albert. Z. Wang
Affiliations:
Illinois Institute of Technology, Chicago, IL;Illinois Institute of Technology, Chicago, IL;Illinois Institute of Technology, Chicago, IL;Illinois Institute of Technology, Chicago, IL;Illinois Institute of Technology, Chicago, IL;Illinois Institute of Technology, Chicago, IL
Venue:
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Year:
2002

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Abstract

The challenges for developing an ESD (Electro-static Discharge) layout extractor originate from unconventional layout patterns of ESD protection devices, parasitic ESD device extraction and device count reduction. This paper reports a new technology-independent layout extractor, ESDExtractor, which is capable of extracting all types of ESD devices and answers the demands for ESD design verification. General methodology to extract both intentional and parasitic ESD devices, specific algorithms and implementation methods for efficiencyenhancement are presented, followed by a design example.