Optimizing HW/SW Codesign towards Reliability for Critical-Application Systems

• Authors:

• F. Vargas;E. Bezerra;L. Wulff;D. Barros, Jr.

• Affiliations:

• -;-;-;-

• Venue:
• ATS '98 Proceedings of the 7th Asian Test Symposium
• Year:
• 1998