An Arithmetic Structure for Test Data Horizontal Compression
Proceedings of the conference on Design, automation and test in Europe - Volume 1
| Hi-index | 0.00 |
In recent years, accumulators have been shown to be efficient pattern generators and response compactors for built-in self-test. Many circuits contain modules which can be configured as accumulators just by controlling these modules adequately. This paper presents algorithms that find all possible accumulator configurations in a circuit and optimize the control of the accumulators for fast test application or inexpensive test control implementation.