Resource Allocation and Test Scheduling for Concurrent Test of Core-Based SOC Design

Authors:
Yu Huang;Wu-Tung Cheng;Chien-Chung Tsai;Nilanjan Mukherjee;Omer Samman;Yahya Zaidan;Sudhakar M. Reddy
Affiliations:
-;-;-;-;-;-;-
Venue:
ATS '01 Proceedings of the 10th Anniversary Compendium of Papers from Asian Test Symposium 1992-2001
Year:
2001

Citing 0
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Abstract

A method to solve the resource allocation and testscheduling problems together in order to achieveconcurrent test for core-based System-On-Chip (SOC)designs is presented in this paper. The primary objectivefor concurrent SOC test is to reduce test applicationtime. The methodology used in this paper is not limited toany specific Test Access Mechanism (TAM).Additionally, it can also be applied for test budgetingduring the design phase to obtain a tradeoff between testapplication time and SOC pins needed. In this paper, theabove problem is formulated as a well-known 2-dimensionalbin-packing problem. A best-fit heuristicalgorithm is employed to obtain satisfactory results asdemonstrated in Section 3.