Specification Coverage Aided Test Selection

  • Authors:
  • Tuomo Pyhälä;Keijo Heljanko

  • Affiliations:
  • -;-

  • Venue:
  • ACSD '03 Proceedings of the Third International Conference on Application of Concurrency to System Design
  • Year:
  • 2003

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Abstract

In this paper test selection strategies in formal conformance testing are considered. As the testing conformance relation we use the ioco relation, and extend the previously presented on-the-fly test generation algorithms for ioco to include test selection heuristic based on a specification coverage metric. The proposed method combines a greedy test selection with randomization to guarantee completeness. As a novel implementation technique we employ bounded model checking for lookahead in greedy test selection.