The program dependence graph and its use in optimization
ACM Transactions on Programming Languages and Systems (TOPLAS)
Interprocedural slicing using dependence graphs
ACM Transactions on Programming Languages and Systems (TOPLAS)
Generalized algorithmic debugging and testing
PLDI '91 Proceedings of the ACM SIGPLAN 1991 conference on Programming language design and implementation
The chaining approach for software test data generation
ACM Transactions on Software Engineering and Methodology (TOSEM)
Computation of Dynamic Program Slices for Unstructured Programs
IEEE Transactions on Software Engineering
A graphical development and debugging environment for parallel programs
Parallel Computing - Special issue: distributed and parallel systems: environments and tools
Hybrid slicing: integrating dynamic information with static analysis
ACM Transactions on Software Engineering and Methodology (TOSEM)
The AETG System: An Approach to Testing Based on Combinatorial Design
IEEE Transactions on Software Engineering
ADTEST: A Test Data Generation Suite for Ada Software Systems
IEEE Transactions on Software Engineering
Java class visualization for teaching object-oriented concepts
SIGCSE '98 Proceedings of the twenty-ninth SIGCSE technical symposium on Computer science education
SIGCSE '98 Proceedings of the twenty-ninth SIGCSE technical symposium on Computer science education
Software visualization of LR parsing and synthesized attribute evaluation
Software—Practice & Experience
Correct Program Slicing of Database Operations
IEEE Software
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This paper presents the ITAD (Integrated Testing and Debugging) system that integrates program testing and debugging processes into a series of consecutive processes and supports automating each of these processes. It also illustrates an example of testing and debugging in the ITAD system. In the system, a programmer can easily create necessary test paths, find the test data that force the program to run along the created test paths, test the program using these test data, and detect faults if failures occur during program testing.