Test Sequences Generation from LUSTRE Descriptions: GATEL

  • Authors:
  • Bruno Marre;Agnes Arnould

  • Affiliations:
  • -;-

  • Venue:
  • ASE '00 Proceedings of the 15th IEEE international conference on Automated software engineering
  • Year:
  • 2000

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Abstract

We describe a test sequence generation method from LUSTRE descriptions and its companion tool, GATEL. The LUSTRE language is declarative and describes synchronous data-flow computations. It is used for reactive control/command systems, mainly for electrical power production applications. Such critical applications require a high level of reliability. While this language benefits from powerful verification tools, there is still a demand for adequate testing techniques. The method and the tool described here can be applied during unit and integration testing, according to a structural (glass box) or functional (black box) test selection strategy. The test generation tool uses some interpretation of the language constructs as Boolean and integer interval constraints. Test sequence generation is automated using constraint logic programming techniques. The method and the tool are illustrated on an example extracted from an industrial case study.