Parametric Feature Detection

  • Authors:
  • Shree K. Nayar;Simon Baker;Hiroshi Murase

  • Affiliations:
  • -;-;-

  • Venue:
  • CVPR '96 Proceedings of the 1996 Conference on Computer Vision and Pattern Recognition (CVPR '96)
  • Year:
  • 1996

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Abstract

We propose an algorithm to automatically construct feature detectors for arbitrary parametric features. To obtain a high level of robustness we advocate the use of realistic multi-parameter feature models and incorporate optical and sensing effects. Each feature is represented as a densely sampled parametric manifold in a low dimensional subspace of a Hilbert space. During detection, the brightness distribution around each image pixel is projected into the subspace. If the projection lies sufficiently close to the feature manifold, the feature is detected and the location of the closest manifold point yields the feature parameters. The concepts of parameter reduction by normalization, dimension reduction, pattern rejection, and heuristic search are all employed to achieve the required efficiency. By applying the algorithm to appropriate parametric feature models, detectors have been constructed for five features, namely, step edge, roof edge, line, corner, and circular disc. Detailed experiments are reported on the robustness of detection and the accuracy of parameter estimation.