Design of concurrently testable microprogrammed control units

Authors:
Masood Namjoo
Affiliations:
Center for Reliable Computing, Departments of Electrical Engineering and Computer Science, Stanford University, Stanford, CA
Venue:
MICRO 15 Proceedings of the 15th annual workshop on Microprogramming
Year:
1982

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Abstract

Four schemes for the design of concurrently testable microprogrammed control units are presented. In Schemes 1 and 2 the concept of path signatures is used for detection of malfunctions in the control unit. Two different methods for computation of signatures are given. In Schemes 3 and 4, a check-symbol is assigned to each microinstruction and the integrity of these check-symbols is checked concurrently. A deterministic approach is used for generation of check-symbols in Scheme 4. A comparative study of these schemes is done with respect to storage and time overhead, error coverage, and implementation complexity.