Measurement and Application of Fault Latency
IEEE Transactions on Computers - The MIT Press scientific computation series
Measurement and modeling of computer reliability as affected by system activity
ACM Transactions on Computer Systems (TOCS)
Measurement-Based Analysis of Error Latency
IEEE Transactions on Computers
The Effect of Program Behavior on Fault Observability
IEEE Transactions on Computers
Computer
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The difficulty with the measurement of fault latency is due to the lack of observability of the fault occurrence and error generation instants in a production environment. The authors describe an experiment, using data from a VAX 11/780 under real workload, to study fault latency in the memory subsystem accurately. Fault latency distributions are generated for stuck-at-zero (s-a-0) and stuck-at-one (s-a-1) permanent fault models. The results show that the mean fault latency of an s-a-0 fault is nearly five times that of the s-a-1 fault. An analysis of variance is performed to quantify the relative influence of different workload measures on the evaluated latency.