Selecting Software Test Data Using Data Flow Information
IEEE Transactions on Software Engineering
Software diversity in computerized control systems
Software diversity in computerized control systems
Software testing techniques (2nd ed.)
Software testing techniques (2nd ed.)
Test Selection Based on Finite State Models
IEEE Transactions on Software Engineering
The Z notation: a reference manual
The Z notation: a reference manual
Specifying a Safety-Critical Control System in Z
IEEE Transactions on Software Engineering
Dependability: Basic Concepts and Terminology
Dependability: Basic Concepts and Terminology
IEEE Software
IEEE Transactions on Software Engineering
EDCC-1 Proceedings of the First European Dependable Computing Conference on Dependable Computing
Design Fault Tolerance in Operating Systems Based on a Standardization Project
FTCS '95 Proceedings of the Twenty-Fifth International Symposium on Fault-Tolerant Computing
Testing Software Design Modeled by Finite-State Machines
IEEE Transactions on Software Engineering
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We have been exploring means of improving design dependability based on the TRON loose standardization approach. Our study ranges from design fault tolerance to design fault avoidance. With regard to design fault tolerance, we have been developing an MLDD (Multi-Layered Design Diversity) architecture that adopts design diversity at an application program layer, an operating system layer, and a hardware layer. It is noteworthy that a standardization project in which multiple manufacturers independently develop implementations from one predefined interface specification is equal to design diversity, which is widely used in a number of critical systems to provide design fault tolerance. With regard to design fault avoidance, we have developed a test generation method that first derives tests from a specification, adapting them to the internal structure of each implementation. This paper describes these methods, focusing on, how they take advantage of the TRON loose standardization.