AC-JTAG: Empowering JTAG beyond Testing DC Nets

Authors:
Sung S. Chung;Sang H. Baeg
Affiliations:
-;-
Venue:
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Year:
2001

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Abstract

This paper presents the new technology that extendstoday's JTAG's capability from DC domain to both ACand DC domains. New concept, AC_EXTEST isintroduced to support AC interconnection test and to havebackward compatibility with EXTEST. It leveragesexisting application software available within boundary-scantest industry to promote this technology tomanufacturing floor with minimal impact.