Efficient Design of System Test: A Layered Architecture

Authors:
Andrea Baldini;Alfredo Benso;Paolo Prinetto;Sergio Mo;Andrea Taddei
Affiliations:
-;-;-;-;-
Venue:
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Year:
2002

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Abstract

Starting from the idea of a general methodology to transform design specifications into system level functional test patterns for complex embedded systems, we propose a layered architecture as basis of such process. The architecture aims at strongly simplifying the test design, allowing the test engineer to concentrate on the high level parts of the system and wrapping all the complexity of the test environment.The results are then verified on a complex case study of automotive applications.