Test vector decomposition-based static compaction algorithms for combinational circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Efficient Static Compaction of Test Sequence Sets through the Application of Set Covering Techniques
Proceedings of the conference on Design, automation and test in Europe - Volume 1
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Large numbers of test stimuli impact on test application time and cost of test application. Hence there is the need to keep numbers of test stimuli low while maintaining as high fault coverage as possible. In this paper, static compaction of test stimuli is seen as a minimization problem. The task of static compaction of a set of test stimuli has been formulated as a minimum covering problem. Based on the concept of minimization, a method of static compaction has been developed. Results of experiments conducted to evaluate the method are also presented. The method achieved a significant compaction of sets of test stimuli that had previously been compacted by means of a test generation algorithm that features dynamic compaction.