Fault Detection and Diagnosis Using Wavelet Based Transient Current Analysis
Authors:
S. Bhunia;K. Roy
Affiliations:
School of Electrical and Computer Engineering, Purdue Univ ersity, W. Lafa yette, IN;School of Electrical and Computer Engineering, Purdue Univ ersity, W. Lafa yette, IN
Venue:
Proceedings of the conference on Design, automation and test in Europe