A measurement-based model for workload dependence of CPU errors
IEEE Transactions on Computers - The MIT Press scientific computation series
Measurement and Application of Fault Latency
IEEE Transactions on Computers - The MIT Press scientific computation series
Measurement-Based Analysis of Error Latency
IEEE Transactions on Computers
Dependability analysis of fault-tolerant systems: a literature survey
Microprocessing and Microprogramming
X-Ware Reliability and Availability Modeling
IEEE Transactions on Software Engineering
Reliability Issues in Computing System Design
ACM Computing Surveys (CSUR)
Dependability: Basic Concepts and Terminology
Dependability: Basic Concepts and Terminology
Increasing software reliability using a signature method
Information Sciences: an International Journal
| Hi-index | 0.04 |
Abstract: Results of fault injection experiments performed under different conditions can only be related to each other, if their interpretation is based on a thorough understanding of activation and propagation of faults and errors. We analyze these processes by applying a special layer model of a computing system. Our aim is to model the transformation of a fault on a signal line into a system failure as the propagation of erroneous information through multiple layers. Two specific layers that describe the fault activation process have been sufficiently completed and are presented here. A quantification for these is derived and different applications are summarized. Excellent correspondence between analytical results based on modeling and experimental data is found. A prediction of fault activation with high accuracy is possible, as well as a quantitative evaluation of the effect of synchronizing fault injection.