An Industrial Environment for High-Level Fault-Tolerant Structures Insertion and Validation

Authors:
Luis Berrojo;Isabel González;Fulvio Corno;Matteo Sonza-Reorda;Giovanni Squillero;Luis Entrena;Celia Lopez
Affiliations:
-;-;-;-;-;-;-
Venue:
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
Year:
2002

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Abstract

When designing a VL I circuits, most of the efforts are now performed at levels of abstractions higher than gate. Correspondingly to this clear trend, there is a growing request to tackle safety-critical issues directly at the RT-level. This paper presents a complete environment for considering safety issues at the RT level. The environment was implemented and tested by an industry for devising a sample safety-critical device. Designers were permitted to assess the effects of transient faults, automatically add fault-tolerant structures, and validate the results working on the same circuit descriptions and acting in a coherent framework. The evaluation showed the effectiveness of the proposed environment.