Strip line detection and thinning by RPCL-based local PCA

Authors:
Zhi-Yong Liu;Kai-Chun Chiu;Lei Xu
Affiliations:
Department of Computer Science and Engineering, The Chinese University of Hong Kong, Shatin, N.T., Hong Kong, PR China;Department of Computer Science and Engineering, The Chinese University of Hong Kong, Shatin, N.T., Hong Kong, PR China;Department of Computer Science and Engineering, The Chinese University of Hong Kong, Shatin, N.T., Hong Kong, PR China
Venue:
Pattern Recognition Letters
Year:
2003

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Abstract

We solve the tasks of strip line detection and thinning in image processing and pattern recognition with the help of a statistical learning technique called rival penalized competitive learning based local principal component analysis. Due to its model selection and noise resistance ability, the technique is experimentally shown to outperform conventional Hough transform and thinning algorithms.