Expert system technology applied to the testing of complex digital electronic architectures. texas: a synergistic test strategy planning and functional test pattern generation methodology applicable to the design, development and testing of complex digital electronic circuits

  • Authors:
  • Steven John Cosgrove

  • Affiliations:
  • -

  • Venue:
  • Expert system technology applied to the testing of complex digital electronic architectures. texas: a synergistic test strategy planning and functional test pattern generation methodology applicable to the design, development and testing of complex digital electronic circuits
  • Year:
  • 1989

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Abstract